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Showing posts with the label Defects in Software development

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SQL Query: 3 Methods for Calculating Cumulative SUM

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SQL provides various constructs for calculating cumulative sums, offering flexibility and efficiency in data analysis. In this article, we explore three distinct SQL queries that facilitate the computation of cumulative sums. Each query leverages different SQL constructs to achieve the desired outcome, catering to diverse analytical needs and preferences. Using Window Functions (e.g., PostgreSQL, SQL Server, Oracle) SELECT id, value, SUM(value) OVER (ORDER BY id) AS cumulative_sum  FROM your_table; This query uses the SUM() window function with the OVER clause to calculate the cumulative sum of the value column ordered by the id column. Using Subqueries (e.g., MySQL, SQLite): SELECT t1.id, t1.value, SUM(t2.value) AS cumulative_sum FROM your_table t1 JOIN your_table t2 ON t1.id >= t2.id GROUP BY t1.id, t1.value ORDER BY t1.id; This query uses a self-join to calculate the cumulative sum. It joins the table with itself, matching rows where the id in the first table is greater than or

2 Root Causes for Defects in Software Development

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Miscommunication Miscommunication is a common factor, which can be defined as inaccurate statements or information missing that is required for the action to be done successfully. This miscommunication ends up in the documentation or verbal communication that occurs. Instead of spending time to make sure everything is accurate, statements are made that are untrue or unclear. When this occurs at the beginning of the change process the bad information continues down through the process. Decisions and design are made based on it.  At some point it gets realized that the information is bad and a defect is created. In the common project process that could be classified as linear, most defects are not found until in the later phase of development and unit testing has started. Process Defects This would be similar to a defect a machine makes in manufacturing. Even though the input is accurate, the process itself causes a defect to occur.  The original process was prone to defects no matt